ABOUT US
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Scanimetrics is focused on wireless virtual probe technology to test semiconductor chips, resolving the issues and bottlenecks imposed on semiconductor manufacturers by current testing methods.
Our technology will have a profoundly positive impact on chip size; the smaller size of these products will be enabled by Scanimetrics’ chip scale communication, advanced packaging and System-in-Package (SiP) applications.
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PRODUCTS & SOLUTIONS
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| Scanimetrics’ technology allows for wireless, non-contact testing of semiconductor wafers. The technology applies to chips with active electronics, including standard integrated circuits (ICs), which require testing at the wafer level and relies on short-range, near field communications to transfer data at gigabit per second rates between the probe card and the device under test (DUT) on a wafer.
The probe consists of a CMOS device with micro antenna structures and transceiver circuits.
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LATEST NEWS
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INTERESTED IN JOINING OUR TEAM?
Scanimetrics is looking for people with the experience and enthusiasm to contribute to
our growing company.
Go HERE for more information.
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